Title of article
Incorporating Voltage Fluctuations of the Power Distribution Network into the Transient Analysis of CMOS Logic Gates
Author/Authors
Kevin T. Tang and Eby G. Friedman ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
11
From page
249
To page
259
Keywords
power distribution network , IR drops , system-on-a-chip
Journal title
Analog Integrated Circuits and Signal Processing
Serial Year
2002
Journal title
Analog Integrated Circuits and Signal Processing
Record number
367214
Link To Document