Title of article :
On-Chip Evaluation of Oscillation-Based-Test Output Signals for Switched-Capacitor Circuits
Author/Authors :
Diego V?zquez، نويسنده , , Gloria Huertas، نويسنده , , Gildas Leger، نويسنده , , Eduardo Peral?as، نويسنده , , Adoraci?n Rueda and José Luis Huertas ، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2002
Pages :
11
From page :
201
To page :
211
Keywords :
Test interpretation , oscillation-based-test (OBT) , analog testing , on-chip evaluation of testsignals , oversampling modulators
Journal title :
Analog Integrated Circuits and Signal Processing
Serial Year :
2002
Journal title :
Analog Integrated Circuits and Signal Processing
Record number :
367275
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=367275
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