Title of article
Fault analysis and automatic test pattern generation for break faults in programmable logic arrays
Author/Authors
Hwang، نويسنده , , G.-H.; Shen، نويسنده , , W.-Z.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1996
Pages
10
From page
157
To page
166
Journal title
I E T Circuits, Devices and Systems
Serial Year
1996
Journal title
I E T Circuits, Devices and Systems
Record number
371104
Link To Document