مرکز منطقه ای اطلاع رساني علوم و فناوري - Accelerated quasi-DC method and circuit for measuring the gate-drain coupling capacitance for devices within a CMOS process technology

Title of article :

Accelerated quasi-DC method and circuit for measuring the gate-drain coupling capacitance for devices within a CMOS process technology

Author/Authors :

Manku، نويسنده , , T.; Singh، نويسنده , , G.، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 1996

Pages :

From page :

302

To page :

306

Journal title :

I E T Circuits, Devices and Systems

Serial Year :

1996

Journal title :

I E T Circuits, Devices and Systems

Record number :

371128

Link To Document :