Title of article
Power-oriented partial-scan design approach
Author/Authors
Jou، نويسنده , , J.-Y.; Nien، نويسنده , , M.-C.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1998
Pages
7
From page
229
To page
235
Keywords
Automatic test pattern genevation , Partial scan approach , VLSL Algorithms , Design
Journal title
I E T Circuits, Devices and Systems
Serial Year
1998
Journal title
I E T Circuits, Devices and Systems
Record number
371248
Link To Document