Title of article :
Testability and test compaction for decision diagram circuits
Author/Authors :
Bystrov، نويسنده , , A.; Almaini، نويسنده , , A.E.A.، Almaini, نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Pages :
6
From page :
153
To page :
158
Journal title :
I E T Circuits, Devices and Systems
Serial Year :
1999
Journal title :
I E T Circuits, Devices and Systems
Record number :
371314
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=371314
