Title of article
Test of data retention faults in CMOS SRAMs using special DFT circuitries
Author/Authors
Champac، نويسنده , , V.H.; Avendano، نويسنده , , V.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
5
From page
78
To page
82
Journal title
I E T Circuits, Devices and Systems
Serial Year
2004
Journal title
I E T Circuits, Devices and Systems
Record number
371604
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