Title of article :
Impact of technology scaling on the 1/f noise of thin and thick gate oxide deep submicron NMOS transistors
Author/Authors :
Chew، نويسنده , , K.W.; Yeo، نويسنده , , K.S.; Chu، نويسنده , , S.-F.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
7
From page :
415
To page :
421
Journal title :
I E T Circuits, Devices and Systems
Serial Year :
2004
Journal title :
I E T Circuits, Devices and Systems
Record number :
371656
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=371656
