مرکز منطقه ای اطلاع رساني علوم و فناوري - Olefin metathesis catalyst.: III. Angle-resolved XPS and depth profiling study of a tungsten oxide layer on silica

Title of article :

Olefin metathesis catalyst.: III. Angle-resolved XPS and depth profiling study of a tungsten oxide layer on silica

Author/Authors :

F. Verpoort، نويسنده , , A. R. Bossuyt and L. Verdonck، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 1996

Pages :

From page :

151

To page :

163

Keywords :

Angle-resolved X-ray photoelectron spectroscopy , Catalyst , Depth profiling , WOי , SiOz/Si (100) , X-ray photoelectronspectroscopy

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Serial Year :

1996

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Record number :

378730

Link To Document :