مرکز منطقه ای اطلاع رساني علوم و فناوري - Thermal desorption of oxides on Si(100): a case study for the scanning photoelectron microscope at MAX-LAB

Title of article :

Thermal desorption of oxides on Si(100): a case study for the scanning photoelectron microscope at MAX-LAB

Author/Authors :

U. Johansson، نويسنده , , H. Zhang and R. Nyholm، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 1997

Pages :

From page :

To page :

Keywords :

Photoelectron microscopy , Silicon-oxide , Spectromicroscopy

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Serial Year :

1997

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Record number :

378770

Link To Document :