• Title of article

    Account of photoelectron elastic determination of overlayer thickness, in-depth profiling, escape depth, attenuation coefficients and intensities in surface systems

  • Author/Authors

    V. I. Nefedov and I. S. Fedorova، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1997
  • Pages
    28
  • From page
    221
  • To page
    248
  • Keywords
    Overlayer thickness determination , Attenuation lengths of photoelectrons insolids , Elastic scattering , In-depth profiling
  • Journal title
    JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
  • Serial Year
    1997
  • Journal title
    JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
  • Record number

    378808

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=378808