مرکز منطقه ای اطلاع رساني علوم و فناوري - The interaction between vapor-deposited Al atoms and methylester-terminated self-assembled monolayers studied by time-of-flight secondary ion mass spectrometry, X-ray photoelectron spectroscopy and infrared reflectance spectroscopy

Title of article :

The interaction between vapor-deposited Al atoms and methylester-terminated self-assembled monolayers studied by time-of-flight secondary ion mass spectrometry, X-ray photoelectron spectroscopy and infrared reflectance spectroscopy

Author/Authors :

G. L. Fisher، نويسنده , , Dean A. Hooper، نويسنده , , R. L. Opila، نويسنده , , D. R. Jung، نويسنده , , D. L. Allara and N. Winograd، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 1999

Pages :

From page :

139

To page :

148

Keywords :

Infrared , Overlayer , Monolayer , Metal deposition , Time-of-flight

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Serial Year :

1999

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Record number :

379216

Link To Document :

https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=379216