مرکز منطقه ای اطلاع رساني علوم و فناوري - Combined near edge X-ray absorption fine structure and X-ray photoemission spectroscopies for the study of amorphous carbon thin films

Title of article :

Combined near edge X-ray absorption fine structure and X-ray photoemission spectroscopies for the study of amorphous carbon thin films

Author/Authors :

Francisco J. Diaz، نويسنده , , S. Anders، نويسنده , , X. Zhou، نويسنده , , E. J. Moler، نويسنده , , S. A. Kellar and Z. Hussain، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 1999

Pages :

From page :

545

To page :

550

Keywords :

NEXAFS , Amorphous carbon , Amorphous surfaces , thin films , XPS

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Serial Year :

1999

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Record number :

379313

Link To Document :