Title of article
XPS studies and factor analysis of PbS nanocrystal-doped SiO2 thin films
Author/Authors
R. Reiche، نويسنده , , R. Thielsch، نويسنده , , S. Oswald and K. Wetzig، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
11
From page
161
To page
171
Keywords
XPS factor analysis , Small size clusters , PbS , SiO , Sputtering effects
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Serial Year
1999
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Record number
379398
Link To Document