Title of article :
Hot-electron transport processes in ballistic-electron emission microscopy at Au–Si interfaces
Author/Authors :
M. D?hne-Prietsch and T. Kalka، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
12
From page :
211
To page :
222
Keywords :
Ballistic-electron emission microscopy , Hot-electron transport , Scattering processes , Interface transmission
Journal title :
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Serial Year :
2000
Journal title :
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Record number :
379438
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=379438
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