Title of article
X-ray photoelectron diffraction on SiC and AlN epitaxial films: polytype structure and polarity
Author/Authors
Bernd Schr?ter، نويسنده , , Aimo Winkelmann and Wolfgang Richter، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
8
From page
443
To page
450
Keywords
silicon carbide , Nitrides , Single crystal surfaces , X-ray photoelectronspectroscopy , Photoelectron diffraction , Molecular beam epitaxy
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Serial Year
2001
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Record number
379525
Link To Document