مرکز منطقه ای اطلاع رساني علوم و فناوري - X-ray photoelectron diffraction on SiC and AlN epitaxial films: polytype structure and polarity

Title of article :

X-ray photoelectron diffraction on SiC and AlN epitaxial films: polytype structure and polarity

Author/Authors :

Bernd Schr?ter، نويسنده , , Aimo Winkelmann and Wolfgang Richter، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2001

Pages :

From page :

443

To page :

450

Keywords :

silicon carbide , Nitrides , Single crystal surfaces , X-ray photoelectronspectroscopy , Photoelectron diffraction , Molecular beam epitaxy

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Serial Year :

2001

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Record number :

379525

Link To Document :