مرکز منطقه ای اطلاع رساني علوم و فناوري - X-ray photoelectron diffraction (XPD) study of the atomic structure of the ultrathin CdS phase deposited on Ag(111) by electrochemical atomic layer epitaxy (ECALE)

Title of article :

X-ray photoelectron diffraction (XPD) study of the atomic structure of the ultrathin CdS phase deposited on Ag(111) by electrochemical atomic layer epitaxy (ECALE)

Author/Authors :

Tiziana Cecconi، نويسنده , , Andrea Atrei، نويسنده , , Ugo Bardi، نويسنده , , Francesca Forni، نويسنده , , Massimo Innocenti، نويسنده , , Francesca Loglio، نويسنده , , Maria Luisa Foresti and Gianfranco Rovida، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2001

Pages :

From page :

563

To page :

568

Keywords :

Electrochemical atomic layer epitaxy: ECALE , Atomic layer epitaxy: ALE , X-ray photoelectron diffraction: XPD , CDS , Ultrathin films , XPS , Photoelectron spectroscopy

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Serial Year :

2001

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Record number :

379544

Link To Document :

https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=379544