Title of article
Determination of the phase composition of surface layers of porous silicon by ultrasoft X-ray spectroscopy and X-ray photoelectron spectroscopy techniques
Author/Authors
V. A. Terekhov، نويسنده , , V. M. Kashkarov، نويسنده , , E.Yu. Manukovskii، نويسنده , , A. V. Schukarev and E. P. Domashevskaya، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
6
From page
895
To page
900
Keywords
X-ray photoelectron spectroscopy , Porous silicon , Mathematical simulation of the spectra , X-ray emission spectra
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Serial Year
2001
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Record number
379598
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