Title of article
Chemical analysis of plasma-polymerized films: The application of X-ray photoelectron spectroscopy (XPS), X-ray absorption spectroscopy (NEXAFS) and fourier transform infrared spectroscopy (FTIR)
Author/Authors
I. Retzko، نويسنده , , J. F. Friedrich، نويسنده , , A. Lippitz and W. E. S. Unger، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
19
From page
111
To page
129
Keywords
chemical characterization , Depositionprocess , stability , Plasma polymer , Styrene , Ethylene , Acetylene , Butadiene , XPS , NEXAFS , FTIR
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Serial Year
2001
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Record number
379674
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