مرکز منطقه ای اطلاع رساني علوم و فناوري - Chemical analysis of plasma-polymerized films: The application of X-ray photoelectron spectroscopy (XPS), X-ray absorption spectroscopy (NEXAFS) and fourier transform infrared spectroscopy (FTIR)

Title of article :

Chemical analysis of plasma-polymerized films: The application of X-ray photoelectron spectroscopy (XPS), X-ray absorption spectroscopy (NEXAFS) and fourier transform infrared spectroscopy (FTIR)

Author/Authors :

I. Retzko، نويسنده , , J. F. Friedrich، نويسنده , , A. Lippitz and W. E. S. Unger، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2001

Pages :

From page :

111

To page :

129

Keywords :

chemical characterization , Depositionprocess , stability , Plasma polymer , Styrene , Ethylene , Acetylene , Butadiene , XPS , NEXAFS , FTIR

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Serial Year :

2001

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Record number :

379674

Link To Document :

https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=379674