مرکز منطقه ای اطلاع رساني علوم و فناوري - Photoelectron diffraction study of the structures of silicon surfaces

Title of article :

Photoelectron diffraction study of the structures of silicon surfaces

Author/Authors :

Shozo Kono، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2002

Pages :

From page :

To page :

Keywords :

Silicon surfaces , X-ray photoelectron diffraction , Photoelectron diffraction , Auger electron diffraction

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Serial Year :

2002

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Record number :

379796

Link To Document :