مرکز منطقه ای اطلاع رساني علوم و فناوري - Surface electronic states of Yb silicide ultrathin films studied with He metastable deexcitation spectroscopy

Title of article :

Surface electronic states of Yb silicide ultrathin films studied with He metastable deexcitation spectroscopy

Author/Authors :

S. H. Baker and S. D’Addato، نويسنده , , L. Pasquali and S. Nannarone، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2002

Pages :

From page :

109

To page :

115

Keywords :

Metal–semiconductor interfaces , Ytterbium , Silicon , Metastable induced electron spectroscopy , low energy electron diffraction

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Serial Year :

2002

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Record number :

379822

Link To Document :