Title of article :
Application of AES and EELS for surface/interface characterization
Author/Authors :
N. I. Plusnin، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
4
From page :
161
To page :
164
Keywords :
Metal , AES , EELS , Surface , Interface , Semiconductor
Journal title :
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Serial Year :
2004
Journal title :
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Record number :
380027
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=380027
