مرکز منطقه ای اطلاع رساني علوم و فناوري - High-resolution XES and RIXS studies with a von Hamos Bragg crystal spectrometer

Title of article :

High-resolution XES and RIXS studies with a von Hamos Bragg crystal spectrometer

Author/Authors :

J. Hoszowska and J. -Cl. Dousse، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2004

Pages :

From page :

687

To page :

690

Keywords :

XES , Atomic-level widths , Double photoexcitation , RIXS , High-resolution X-ray spectrometer

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Serial Year :

2004

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Record number :

380117

Link To Document :