مرکز منطقه ای اطلاع رساني علوم و فناوري - Reflected electron energy loss microscopy (REELM) studies of metals, semiconductors and insulators

Title of article :

Reflected electron energy loss microscopy (REELM) studies of metals, semiconductors and insulators

Author/Authors :

E. Paparazzo and G. M. Ingo، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2005

Pages :

From page :

221

To page :

233

Keywords :

surfaces , Scanning Auger microscopy , insulators , EELS spectroscopy

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Serial Year :

2005

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Record number :

380223

Link To Document :