Title of article
Reflected electron energy loss microscopy (REELM) studies of metals, semiconductors and insulators
Author/Authors
E. Paparazzo and G. M. Ingo، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
13
From page
221
To page
233
Keywords
surfaces , Scanning Auger microscopy , insulators , EELS spectroscopy
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Serial Year
2005
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Record number
380223
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