مرکز منطقه ای اطلاع رساني علوم و فناوري - Antiferromagnetic domain modulation of NiO(1 0 0) induced by thickness-dependent interfacial coupling with Cr overlayer

Title of article :

Antiferromagnetic domain modulation of NiO(1 0 0) induced by thickness-dependent interfacial coupling with Cr overlayer

Author/Authors :

Hai-Lin Sun، نويسنده , , Takahide Tohyama، نويسنده , , Taichi Okuda، نويسنده , , Ayumi Harasawa and Toyohiko Kinoshita، نويسنده , , Nobuo Ueno and Toyohiko Kinoshita، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2005

Pages :

From page :

753

To page :

756

Keywords :

X-ray magnetic linear dichroism (XMLD) , Antiferromagnetic (AFM) domain , X-ray photoemission electron microscopy (XPEEM)

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Serial Year :

2005

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Record number :

380402

Link To Document :

https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=380402