مرکز منطقه ای اطلاع رساني علوم و فناوري - Damage to solid-state photodiodes by vacuum ultraviolet radiation

Title of article :

Damage to solid-state photodiodes by vacuum ultraviolet radiation

Author/Authors :

Uwe Arp، نويسنده , , Ping-Shine Shaw، نويسنده , , Rajeev Gupta and Keith R. Lykke، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2005

Pages :

From page :

1039

To page :

1042

Keywords :

Detector standards , UV Detector , synchrotron radiation , Interface trap states , excimer laser , Radiometry , Photo-lithography , radiation damage

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Serial Year :

2005

Journal title :

JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA

Record number :

380463

Link To Document :