Title of article :
Input and reverse transfer capacitance measurement of MOS-gated power transistors under high current flow
Author/Authors :
Deml، نويسنده , , C.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Keywords :
Capacitance measurement , Measurement , DMOS , on-state capacitances.
Journal title :
IEEE Transactions on Industry Applications
Journal title :
IEEE Transactions on Industry Applications
