Title of article
Growth of InGaAs-capped InAs quantum dots characterized by Atomic Force Microscope and Scanning Electron Microscope
Author/Authors
Shen-de Chen، نويسنده , , Chiou-yun Tsai ، نويسنده , , Si-Chen Lee ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
4
From page
407
To page
410
Keywords
InAs quantum dot , Atomic force microscope , phase separation , Surface science , scanning electron microscope
Journal title
Journal of Nanoparticle Research
Serial Year
2004
Journal title
Journal of Nanoparticle Research
Record number
390221
Link To Document