مرکز منطقه ای اطلاع رساني علوم و فناوري - Growth of InGaAs-capped InAs quantum dots characterized by Atomic Force Microscope and Scanning Electron Microscope

Title of article :

Growth of InGaAs-capped InAs quantum dots characterized by Atomic Force Microscope and Scanning Electron Microscope

Author/Authors :

Shen-de Chen، نويسنده , , Chiou-yun Tsai ، نويسنده , , Si-Chen Lee ، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2004

Pages :

From page :

407

To page :

410

Keywords :

InAs quantum dot , Atomic force microscope , phase separation , Surface science , scanning electron microscope

Journal title :

Journal of Nanoparticle Research

Serial Year :

2004

Journal title :

Journal of Nanoparticle Research

Record number :

390221

Link To Document :