Title of article
Drift Compensation for Automatic Nanomanipulation With Scanning Probe Microscopes
Author/Authors
B. Mokaberi and A. A. G. Requicha، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
9
From page
199
To page
207
Keywords
Atomic force microscopes (AFMs) , Kalman filtering , nanoassembly , nanomanipulation , nanorobotics , scanningprobe microscopes , spatial uncertainty.
Journal title
I E E E Transactions on Automation Science and Engineering
Serial Year
2006
Journal title
I E E E Transactions on Automation Science and Engineering
Record number
391820
Link To Document