Title of article :
Quantization of Accumulated Diffused Errors in Error Diffusion
Author/Authors :
T.-C. Chang and J. P. Allebach، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Abstract :
Due to its high image quality and moderate computational
complexity, error diffusion is a popular halftoning algorithm
for use with inkjet printers. However, error diffusion is an
inherently serial algorithm that requires buffering a full row of
accumulated diffused error (ADE) samples. For the best performance
when the algorithm is implemented in hardware, the ADE
data should be stored on the chip on which the error diffusion
algorithm is implemented. However, this may result in an unacceptable
hardware cost. In this paper, we examine the use of quantization
of the ADE to reduce the amount of data that must be
stored.We consider both uniform and nonuniform quantizers. For
the nonuniform quantizers, we build on the concept of tone-dependency
in error diffusion, by proposing several novel featuredependent
quantizers that yield improved image quality at a given
bit rate, compared to memoryless quantizers. The optimal design
of these quantizers is coupled with the design of the tone-dependent
parameters associated with error diffusion. This is done via a
combination of the classical Lloyd–Max algorithm and the training
framework for tone-dependent error diffusion. Our results show
that 4-bit uniform quantization of theADEyields the same halftone
quality as error diffusion without quantization of the ADE. At rates
that vary from 2 to 3 bits per pixel, depending on the selectivity
of the feature on which the quantizer depends, the feature-dependent
quantizers achieve essentially the same quality as 4-bit uniform
quantization.
Keywords :
Error diffusion , memory efficient , Quantization , tone-dependent errordiffusion (TDED). , Accumulated diffused error (ADE)
Journal title :
IEEE TRANSACTIONS ON IMAGE PROCESSING
Journal title :
IEEE TRANSACTIONS ON IMAGE PROCESSING