• Title of article

    On the go with SONOS

  • Author/Authors

    White، نويسنده , , M.H.، نويسنده , , Adams، نويسنده , , D.A.، نويسنده , , Bu، نويسنده , , J.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2000
  • Pages
    10
  • From page
    22
  • To page
    31
  • Abstract
    Advancements in scaling gate insulators for MOS transistors permit low-voltage, silicon-oxide-nitride-silicon (SONOS) nonvolatile semiconductor memories (NVSMs) for a wide range of applications. The continued scaling of SONOS devices offers improved performance with a small cell size, single-level polysilicon with low voltage, fast erase/write, improved memory retention, increased endurance, and radiation hardness. In this article, we discuss scaled SONOS devices, SONOS memory technology, and some SONOS NVSM applications
  • Journal title
    IEEE Circuits and Devices Magazine
  • Serial Year
    2000
  • Journal title
    IEEE Circuits and Devices Magazine
  • Record number

    397389