Title of article
On the go with SONOS
Author/Authors
White، نويسنده , , M.H.، نويسنده , , Adams، نويسنده , , D.A.، نويسنده , , Bu، نويسنده , , J.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
10
From page
22
To page
31
Abstract
Advancements in scaling gate insulators for MOS transistors permit low-voltage, silicon-oxide-nitride-silicon (SONOS) nonvolatile semiconductor memories (NVSMs) for a wide range of applications. The continued scaling of SONOS devices offers improved performance with a small cell size, single-level polysilicon with low voltage, fast erase/write, improved memory retention, increased endurance, and radiation hardness. In this article, we discuss scaled SONOS devices, SONOS memory technology, and some SONOS NVSM applications
Journal title
IEEE Circuits and Devices Magazine
Serial Year
2000
Journal title
IEEE Circuits and Devices Magazine
Record number
397389
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