Title of article :
NANOLAB-a tool for evaluating reliability of defect-tolerant nanoarchitectures
Author/Authors :
Bhaduri، نويسنده , , D.، نويسنده , , Shukla، نويسنده , , S، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
14
From page :
381
To page :
394
Keywords :
Cascaded triple modular redundancy (CTMR) , entropy , Gibbs distribution , interconnect , modeling , Nanotechnology , Noise , Reliability , triple modular redundancy (TMR).
Journal title :
IEEE Transactions on Nanotechnology
Serial Year :
2005
Journal title :
IEEE Transactions on Nanotechnology
Record number :
398504
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=398504
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