• Title of article

    NANOLAB-a tool for evaluating reliability of defect-tolerant nanoarchitectures

  • Author/Authors

    Bhaduri، نويسنده , , D.، نويسنده , , Shukla، نويسنده , , S، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2005
  • Pages
    14
  • From page
    381
  • To page
    394
  • Keywords
    Cascaded triple modular redundancy (CTMR) , entropy , Gibbs distribution , interconnect , modeling , Nanotechnology , Noise , Reliability , triple modular redundancy (TMR).
  • Journal title
    IEEE Transactions on Nanotechnology
  • Serial Year
    2005
  • Journal title
    IEEE Transactions on Nanotechnology
  • Record number

    398504

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=398504