Title of article :
Investigation of electrical characteristics on surrounding-gate and omega-shaped-gate nanowire FinFETs
Author/Authors :
Yiming Li، نويسنده , , Hung-Mu Chou، نويسنده , , Jam-Wem Lee، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
7
From page :
510
To page :
516
Keywords :
three-dimensional (3-D) simulation , device structure , subthresholdswing (SS) , Nanowire , turn-on resistance. , Fabrication , nanodevice , omega-shaped-gate , on/off ratio , fin field-effect transistor (FinFET) , gate capacitance , surrounding gate , Coverage ratio , process technique , quantum correction model , Semiconductor devices
Journal title :
IEEE Transactions on Nanotechnology
Serial Year :
2005
Journal title :
IEEE Transactions on Nanotechnology
Record number :
398521
Link To Document :
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