Title of article :
NANOLAB-a tool for evaluating reliability of defect-tolerant nanoarchitectures
Author/Authors :
Bhaduri، نويسنده , , D.، نويسنده , , Shukla، نويسنده , , S، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
14
From page :
381
To page :
394
Keywords :
triple modular redundancy (TMR). , Noise , entropy , modeling , Reliability , Cascaded triple modular redundancy (CTMR) , Gibbs distribution , Nanotechnology , interconnect
Journal title :
IEEE Transactions on Nanotechnology
Serial Year :
2005
Journal title :
IEEE Transactions on Nanotechnology
Record number :
398745
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=398745
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