Title of article
NANOLAB-a tool for evaluating reliability of defect-tolerant nanoarchitectures
Author/Authors
Bhaduri، نويسنده , , D.، نويسنده , , Shukla، نويسنده , , S، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
14
From page
381
To page
394
Keywords
triple modular redundancy (TMR). , Noise , entropy , modeling , Reliability , Cascaded triple modular redundancy (CTMR) , Gibbs distribution , Nanotechnology , interconnect
Journal title
IEEE Transactions on Nanotechnology
Serial Year
2005
Journal title
IEEE Transactions on Nanotechnology
Record number
398745
Link To Document