Title of article
A New Method to Extract Carrier Velocity in Sub-0.1-$mu$m MOSFETs Using RF Measurements
Author/Authors
Lee، نويسنده , , S، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
4
From page
163
To page
166
Keywords
Parameterestimation , sub-0.1 m. , -parameters , Carrier velocity , device modeling , MOSFET
Journal title
IEEE Transactions on Nanotechnology
Serial Year
2006
Journal title
IEEE Transactions on Nanotechnology
Record number
398820
Link To Document