Title of article :
Reliability-Driven Gate Replication for Nanometer-Scale Digital Logic
Author/Authors :
Chunhong Chen، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2007
Pages :
6
From page :
303
To page :
308
Keywords :
digital logic , gate replication , single-electron tunneling (SET). , Reliability , Redundancy
Journal title :
IEEE Transactions on Nanotechnology
Serial Year :
2007
Journal title :
IEEE Transactions on Nanotechnology
Record number :
398942
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=398942
