مرکز منطقه ای اطلاع رساني علوم و فناوري - Analytical Solutions of the Frequency Shifts of Several Modes in Dynamic Force Microscopy Subjected to AC Electrostatic Force

Title of article :

Analytical Solutions of the Frequency Shifts of Several Modes in Dynamic Force Microscopy Subjected to AC Electrostatic Force

Author/Authors :

Shueei-Muh Lin، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2007

Pages :

From page :

404

To page :

412

Keywords :

frequency shift. , electrostaticforce , Atomic force microscopy (AFM)

Journal title :

IEEE Transactions on Nanotechnology

Serial Year :

2007

Journal title :

IEEE Transactions on Nanotechnology

Record number :

398957

Link To Document :