Author/Authors :
Buchholz، نويسنده , , V.L.، نويسنده , , Nagpal، نويسنده , , M.، نويسنده , , Neilson، نويسنده , , J.B.، نويسنده , , Parsi-Feraidoonian، نويسنده , , R.، نويسنده , , Zarecki، نويسنده , , W.، نويسنده ,
Abstract :
High impedance or down conductor fault detection
devices are now commercially available for evaluation. However,
security and dependability of these devices can not be tested
using conventional relay test apparatus and procedures. This
paper presents a test apparatus and procedures for testing high
impedance fault detection devices. The apparatus is capable of
playing back in real-time waveforms selected from a data
library, which includes seventy seven field recordings of highimpedance
faults and feeder loads. Each recording is approximately
five minutes long and stored in the form of digitized data
sampled at 20 kHz.