Author/Authors :
Boggs، نويسنده , , S.، نويسنده , , Jinbo Kuang، نويسنده , , Andoh، نويسنده , , H.، نويسنده , , Nishiwaki، نويسنده , , S.، نويسنده ,
Abstract :
Transient, nonlinear finite element analysis with coupled
thermal and electric fields is employed to compute the electric
and thermal field distributions in ZnO arrester elements, including
both nonlinear electrical and nonlinear thermal properties. Mechanical
stress in the element is computed during post processing,
based on the thermal field. The data indicate that a metallic protrusion
from the sprayed electrode into the ZnO can cause substantial
temperature rise in a microscopic region around the defect. The effects
of a delamination between the electrode and the ZnO surface
are less severe. Statistical computations have been undertaken to
explore the effect of nonconducting grains on the disk conduction
threshold voltage and disk nonlinearity. The computations yield
similar results to those in the literature based on nonlinear circuit
equations but are much less time consuming.