Title of article :
Statistical analysis of Weibull distributed lifetime data under Type II progressive censoring with binomial removals
Author/Authors :
Tse، Siu Keung نويسنده , , Yang، Chunyan نويسنده , , Yuen، Hak-Keung نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
-1032
From page :
1033
To page :
0
Abstract :
This paper considers the analysis of Weibull distributed lifetime data observed under Type II progressive censoring with random removals, where the number of units removed at each failure time follows a binomial distribution. Maximum likelihood estimators of the parameters and their asymptotic variances are derived. The expected time required to complete the life test under this censoring scheme is investigated.
Keywords :
Bifurcation , Hodgkin-Huxley equation , Excitable media , Current-voltage relationship
Journal title :
JOURNAL OF APPLIED STATISTICS
Serial Year :
2000
Journal title :
JOURNAL OF APPLIED STATISTICS
Record number :
40622
Link To Document :
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