Title of article :
X-ray diffraction analysis of stacking and twin faults in f.c.c. metals: a revision and allowance for texture and non-uniform fault probabilities
Author/Authors :
Mittemeijer، E. J. نويسنده , , Delhez، R. نويسنده , , Keijser، Th. H. de نويسنده , , Velterop، L. نويسنده , , Reefman، D. نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
-295
From page :
296
To page :
0
Abstract :
The description of line profiles from f.c.c. metals containing stacking and twin faults, as derived by Warren, has been revised and extended. It is discussed how fault probabilities can be determined from line profiles and it is shown by simulation that the revision leads to significantly better results.
Keywords :
Electronic paramagnetic resonance (EPR) , Fullerenes , Chemical synthesis , Organic compounds , Infrared spectroscopy
Journal title :
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Serial Year :
2000
Journal title :
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Record number :
41901
Link To Document :
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