Title of article :
Assessment of different X-ray stress measuring techniques for thin titanium nitride coatings
Author/Authors :
Quaeyhaegens، C. نويسنده , , Saerens، A. نويسنده , , Houtte، P. Van نويسنده , , Meert، B. نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Abstract :
The validities of the d-sin2(psi) method, a low incident-beam-angle method and the crystallite-group method are determined for thin titanium nitride coatings, taking the crystallographic texture into account.
Keywords :
Fullerenes , Organic compounds , Chemical synthesis , Infrared spectroscopy , Electronic paramagnetic resonance (EPR)
Journal title :
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Journal title :
JOURNAL OF APPLIED CRYSTALLOGRAPHY
