Title of article :
The Huber G670 imaging-plate Guinier camera tested on beamline I711 at the MAX II synchrotron
Author/Authors :
St?hl، K. نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
-393
From page :
394
To page :
0
Abstract :
The Huber G670 Guinier powder diffractometer provided high-quality Rietveldrefinable data in a matter of seconds using a synchrotron source.
Keywords :
Organic compounds , Electronic paramagnetic resonance (EPR) , Chemical synthesis , Fullerenes , Infrared spectroscopy
Journal title :
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Serial Year :
2000
Journal title :
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Record number :
41916
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=41916
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