Title of article
Displacements from Cu4Ti in a Cu-Ti single crystal using small-angle and diffuse X-ray scattering: a synchrotron radiation study
Author/Authors
Lyon، O. نويسنده , , Servant، C. نويسنده , , Simon، J. P. نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
-927
From page
928
To page
0
Abstract
Single crystals of Cu-2.5 at.% Ti have been studied by small-angle and large-angle Xray scattering to determine the displacements induced by the formation and the coarsening of ordered Cu4Ti precipitates. The variation of the atomic scattering factor of Cu near its absorption edge was used to confirm the nature of the precipitates and to show that the scattering appearing near Bragg peaks was due to the displacements of the atoms from their positions, induced by the formation of the precipitates, and not to the segregation of the Ti atoms.
Keywords
Infrared spectroscopy , Electronic paramagnetic resonance (EPR) , Fullerenes , Organic compounds , Chemical synthesis
Journal title
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Serial Year
2000
Journal title
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Record number
41928
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