Title of article :
Displacements from Cu4Ti in a Cu-Ti single crystal using small-angle and diffuse X-ray scattering: a synchrotron radiation study
Author/Authors :
Lyon، O. نويسنده , , Servant، C. نويسنده , , Simon، J. P. نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
-927
From page :
928
To page :
0
Abstract :
Single crystals of Cu-2.5 at.% Ti have been studied by small-angle and large-angle Xray scattering to determine the displacements induced by the formation and the coarsening of ordered Cu4Ti precipitates. The variation of the atomic scattering factor of Cu near its absorption edge was used to confirm the nature of the precipitates and to show that the scattering appearing near Bragg peaks was due to the displacements of the atoms from their positions, induced by the formation of the precipitates, and not to the segregation of the Ti atoms.
Keywords :
Infrared spectroscopy , Electronic paramagnetic resonance (EPR) , Fullerenes , Organic compounds , Chemical synthesis
Journal title :
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Serial Year :
2000
Journal title :
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Record number :
41928
Link To Document :
بازگشت