مرکز منطقه ای اطلاع رساني علوم و فناوري - Comparison of minority carrier diffusion length measurements in silicon solar cells by the photo-induced open-circuit voltage decay (OCVD) with different excitation sources

Title of article :

Comparison of minority carrier diffusion length measurements in silicon solar cells by the photo-induced open-circuit voltage decay (OCVD) with different excitation sources

Author/Authors :

Ulrich Stutenbaeumer، نويسنده , , Elias Lewetegn، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2000

Pages :

From page :

To page :

Keywords :

Diffusion length , Minority carrier lifetime , Silicon photovoltaic solar cells , Photo-induced open-circuit voltage decay

Journal title :

Renewable Energy

Serial Year :

2000

Journal title :

Renewable Energy

Record number :

421503

Link To Document :

https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=421503