Title of article :
Joint Russian and Bulgarian Academies of Sciences Database of IIntermolecular Potentials and Diffusion Coefficients for Components of the CVD Processes in Microelectronics
Author/Authors :
L. Fokin، نويسنده , , V. Popov، نويسنده , , A. Kalashnikov، نويسنده , , L. Zarkova، نويسنده , , P. Pirgov and I. Petkov ، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Abstract :
The goal of the database (DB) EPIDIF-JRB is to promote the modeling of
gas-phase transport processes in CVD technologies in microelectronics.The
transport properties (molecular diffusion coefficients, viscosity, and thermal
conductivity) of pure gases and gas mixtures in the temperature range 250 to
2000 K and at a pressure <0.1 MPa are calculated using (1) the Chapman–
Enskog method in binary collision approximation and (2) the three-parameter
Lennard–Jones (m–6) iIntermolecular potentials (IP) with 8 < m < 100 for
iInteractions of atoms and quasi-spherical molecules, and (3) the four-parameter
m–6–3 Stockmayer IP for dipole molecules.In addition to the IP parameters
aii, ajj , and aij , the DB also supplies their variance–covariance matrix.For
heavy globular molecules [such as CF4 , SiH4 , Si(CH3)4 , and WF6], the
influence of the vibrational excitation on their effective size is considered.In this
case, the isotropic Lennard–Jones (m–6) IP with temperature-dependent
parameters was defined.At present, the DB EPIDIF-JRB contains 40 species of
importance to Si gas-phase epitaxy processes and IP parameters for 820 pair
iInteractions.It can be used to calculate the viscosity of pure gases and gas mixtures
with any k components (k < 11), and their binary diffusion coefficients,
and to estimate their uncertainty as well.
Keywords :
silicon epitaxy , iIntermolecular potentials , gas viscosity , Database , CVD processes , Diffusion coefficients
Journal title :
International Journal of Thermophysics
Journal title :
International Journal of Thermophysics