Title of article :
Alpha 21164 Testability Strategy
Author/Authors :
Dilip K. Bhavsar John H. Edmondson ، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1997
Pages :
9
From page :
25
To page :
33
Abstract :
A custom DFT strategy solved specific testability and manufacturing issues for this high performance microprocessor. Hardware and software assisted self test and self repair features helped meet aggressive schedule and manufacturing quality and cost goals
Journal title :
IEEE Design and Test of Computers
Serial Year :
1997
Journal title :
IEEE Design and Test of Computers
Record number :
431122
Link To Document :
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