Title of article :
The Economics of System-Level Testing
Author/Authors :
Des Farren
Tony Ambler
، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1997
Abstract :
Competitive pressure to streamline system-level test without affecting product quality is mounting. Identifying the features unique to system-level testing, the authors present key results of production testing based on a new test cost model
Journal title :
IEEE Design and Test of Computers
Journal title :
IEEE Design and Test of Computers