Title of article :
The Economics of System-Level Testing
Author/Authors :
Des Farren Tony Ambler ، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1997
Pages :
8
From page :
51
To page :
58
Abstract :
Competitive pressure to streamline system-level test without affecting product quality is mounting. Identifying the features unique to system-level testing, the authors present key results of production testing based on a new test cost model
Journal title :
IEEE Design and Test of Computers
Serial Year :
1997
Journal title :
IEEE Design and Test of Computers
Record number :
431147
Link To Document :
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