Title of article
Shmoo Plotting: The Black Art of IC Testing
Author/Authors
Keith Baker Jos Van Beers ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1997
Pages
8
From page
90
To page
97
Abstract
Obtaining higher yields from IC fabrication is a never ending goal. Toward that end, shmoo plotting can help bridge the gap between design and test and ultimately show ways to improve a product, process, or manufacturing test program
Journal title
IEEE Design and Test of Computers
Serial Year
1997
Journal title
IEEE Design and Test of Computers
Record number
431152
Link To Document