Title of article :
Shmoo Plotting: The Black Art of IC Testing
Author/Authors :
Keith Baker
Jos Van Beers
، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1997
Abstract :
Obtaining higher yields from IC fabrication is a never ending goal. Toward that end, shmoo plotting can help bridge the gap between design and test and ultimately show ways to improve a product, process, or manufacturing test program
Journal title :
IEEE Design and Test of Computers
Journal title :
IEEE Design and Test of Computers