Title of article :
Shmoo Plotting: The Black Art of IC Testing
Author/Authors :
Keith Baker Jos Van Beers ، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1997
Pages :
8
From page :
90
To page :
97
Abstract :
Obtaining higher yields from IC fabrication is a never ending goal. Toward that end, shmoo plotting can help bridge the gap between design and test and ultimately show ways to improve a product, process, or manufacturing test program
Journal title :
IEEE Design and Test of Computers
Serial Year :
1997
Journal title :
IEEE Design and Test of Computers
Record number :
431152
Link To Document :
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