Title of article :
Testing NASAʹs 3D-Stack MCM Space Flight Computer
Author/Authors :
Koppol Sasidhar
Leon Alkalai
Abhijit Chatterjee
، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1998
Abstract :
Advanced packaging technologies pose major testing challenges for complex designs. The authors present test strategies used in the space flight computer designed for NASAʹs Deep Space-1 mission
Journal title :
IEEE Design and Test of Computers
Journal title :
IEEE Design and Test of Computers
